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BS EN 60749-11:2002
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
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Summary
Environmental testing;Integrated circuits;Mechanical testing;Temperature measurement;Electronic equipment and components;Destructive testing;Temperature;Semiconductor devices;Climate;Thermal testing
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 10/24/2003 |
| Page Count | 12 |
| Themes | Thermal testing |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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