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BS EN 60749-16:2003
Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)
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Summary
Climate;Electronic equipment and components;Environmental testing;Acoustic measurement;Mechanical testing;Holes;Solders;Semiconductor devices;Wires;Non-destructive testing;Noise (spurious signals);Vibration testing;Particulate materials;Integrated circuits;Ceramics
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 06/24/2004 |
| Page Count | 10 |
| Themes | Ceramics |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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24/06/2004
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