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BS EN 60749-19:2003+A1:2010
Semiconductor devices. Mechanical and climatic test methods Die shear strength
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Summary
Integrated circuits;Substrates (insulating);Quality control;Environmental testing;Strength of materials;Semiconductor devices;Shear testing;Shear strength;Electrical components;Climate;Mechanical testing;Electrical equipment;Electronic equipment and components
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 10/31/2010 |
| Page Count | 10 |
| Themes | Electronic equipment and components |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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31/10/2010
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