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BS EN 60749-2:2002
Semiconductor devices. Mechanical and climatic test methods Low air pressure
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Summary
Integrated circuits;Pressure;Electronic equipment and components;Semiconductor devices;Climate;Air;Low-pressure tests;Mechanical testing;Environmental testing
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 09/24/2002 |
| Page Count | 10 |
| Themes | Environmental testing |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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24/09/2002
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