BS EN 60749-24:2004
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BS EN 60749-24:2004

Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST

Summary

Solid-state physics;Accelerated testing;Mechanical testing;Semiconductor devices;Accelerated corrosion tests;Moisture measurement;Climate;Temperature;Humidity;Performance testing;Corrosion resistance;Destructive testing;Electronic equipment and components;Damp-heat tests;Reliability;Environmental testing;Integrated circuits;Testing conditions

Technical characteristics

Publisher British Standards Institution (BSI)
Publication Date 06/24/2004
Page Count 10
Themes Testing conditions
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