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BS EN 60749-25:2003
Semiconductor devices. Mechanical and climatic test methods Temperature cycling
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Summary
Thermal testing;Solders;Electronic equipment and components;Integrated circuits;Environmental testing;Climate;Testing conditions;Thermal-cycling tests;Semiconductor devices;Heating tests;Mechanical testing
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 10/30/2003 |
| Page Count | 16 |
| Themes | Mechanical testing |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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30/10/2003
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