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BS EN 60749-27:2006+A1:2012
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
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Summary
Electrical testing;Grades (quality);Sensitivity;Damage;Semiconductor devices;Classification systems;Electronic equipment and components;Test models;Mechanical testing;Electrostatics;Integrated circuits;Degradation;Climate;Environmental testing
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 01/31/2013 |
| Page Count | 16 |
| Themes | Environmental testing |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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