Superseded
Standard
Historical
BS EN 60749-28:2017
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level
Preview
Summary
Electrostatics;Electric charge;Electronic equipment and components;Electric discharges;Mechanical testing;Semiconductor devices;Test methods;Environmental testing;Integrated circuits
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 07/10/2017 |
| Cancellation Date | 09/06/2022 |
| Page Count | 50 |
| Themes | Integrated circuits |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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