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BS EN 60749-3:2017
Semiconductor devices. Mechanical and climatic test methods External visual examination
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Summary
Integrated circuits;Environmental testing;Mechanical testing;Climate;Electronic equipment and components;Semiconductor devices;External;Non-destructive testing;Visual inspection (testing)
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 11/24/2017 |
| Page Count | 18 |
| Themes | Visual inspection (testing) |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
24/11/2017
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17/09/2002
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