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BS EN 60749-33:2004
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
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Summary
Electronic equipment and components;Solid-state physics;Semiconductor devices;Mechanical testing;Temperature;Environmental testing;Humidity;Destructive testing;Accelerated corrosion tests;Accelerated testing;Integrated circuits;Corrosion resistance;Testing conditions;Pressure;Moisture measurement;Climate;Damp-heat tests
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 06/22/2004 |
| Page Count | 10 |
| Themes | Damp-heat tests |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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