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BS EN 60749-34:2010
Semiconductor devices. Mechanical and climatic test methods Power cycling
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Summary
Destructive testing;Environmental testing;Integrated circuits;Stress;Low voltage;Climate;Electronic equipment and components;Mechanical testing;Thermal stress;Power losses;Electrical testing;Stress analysis;Semiconductor devices
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 02/28/2011 |
| Page Count | 14 |
| Themes | Semiconductor devices |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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28/02/2011
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22/06/2004
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