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BS EN 60749-35:2006
Semiconductor devices. Mechanical and climatic test methods Acoustic microscopy for plastic encapsulated electronic components
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Summary
Integrated circuits;Mechanical testing;Non-destructive testing;Microscopic analysis;Semiconductor devices;Plastics;Encapsulated;Electronic equipment and components;Test equipment;Environmental testing;Packages;Ultrasonic testing;Climate
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 11/30/2006 |
| Page Count | 24 |
| Themes | Climate |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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