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BS EN 60749-36:2003
Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state
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Summary
Endurance testing;Integrated circuits;Impact testing;Semiconductor devices;Mechanical testing;Electronic equipment and components;Acceleration measurement;Acceleration tests;Climate;Environmental testing;Stress;Destructive testing
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 06/19/2003 |
| Page Count | 8 |
| Themes | Destructive testing |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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19/06/2003
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