Superseded
Standard
Historical
BS EN 60749-37:2008
Semiconductor devices. Mechanical and climatic test methods Board level drop method using an accelerometer
Preview
Summary
Printed-circuit boards;Electronic equipment and components;Integrated circuits;Surface mounting devices;Accelerated testing;Environmental testing;Drop tests;Semiconductor devices;Mechanical testing;Impact testing
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 05/30/2008 |
| Cancellation Date | 11/22/2022 |
| Page Count | 22 |
| Themes | Impact testing |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.
Previous versions
30/05/2008
Superseded
Historical