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BS EN 60749-38:2008
Semiconductor devices. Mechanical and climatic test methods Soft error method for semiconductor devices with memory
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Summary
Errors;Environmental testing;Electronic equipment and components;Computer storage devices;Semiconductor devices;Mechanical testing;Integrated circuits;Alpha particles
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 06/30/2008 |
| Page Count | 16 |
| Themes | Alpha particles |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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