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BS EN 60749-40:2011
Semiconductor devices. Mechanical and climatic test methods Board level drop method using a strain gauge
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Summary
Integrated circuits;Drop tests;Mechanical testing;Semiconductor devices;Electronic equipment and components;Impact testing;Strain measurement;Surface mounting devices;Accelerated testing;Environmental testing;Printed-circuit boards
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 09/30/2011 |
| Page Count | 26 |
| Themes | Printed-circuit boards |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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