Superseded
Standard
Historical
BS EN 60749-43:2017
Semiconductor devices - Mechanical and climatic test methods Guidelines for IC reliability qualification plans
Preview
Summary
Reliability;Climatic protection;Mechanical classifiers;Semiconductor materials;Semiconductor technology
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 09/22/2017 |
| Cancellation Date | 07/29/2022 |
| Page Count | 44 |
| Themes | Semiconductor technology |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
22/09/2017
Superseded
Historical