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BS EN 60749-44:2016
Semiconductor devices. Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) method for semiconductor devices
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Summary
Water vapour;Water-vapour tests;Climate;Gas analysis;Integrated circuits;Semiconductor devices;Moisture measurement;Environmental testing;Mechanical testing;Electronic equipment and components
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 11/30/2016 |
| Page Count | 26 |
| Themes | Electronic equipment and components |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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