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Standard
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BS EN 60749-6:2017
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
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Summary
High temperatures;Electronic storage;Semiconductor devices;Semiconductor storage;Climate;Integrated circuits;Environmental testing;Electronic equipment and components;Mechanical testing
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 11/24/2017 |
| Page Count | 12 |
| Themes | Mechanical testing |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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24/11/2017
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10/09/2002
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