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BS EN 60749-7:2011
Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement the analysis of other residual gases
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Summary
Water vapour;Mechanical testing;Climate;Moisture measurement;Integrated circuits;Semiconductor devices;Environmental testing;Water-vapour tests;Electronic equipment and components;Gas analysis
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 09/30/2011 |
| Page Count | 16 |
| Themes | Gas analysis |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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