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BS EN 60749-8:2003
Semiconductor devices. Mechanical and climatic test methods Sealing
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Summary
Climate;Leak tests;Integrated circuits;Semiconductor devices;Environmental testing;Electronic equipment and components;Mechanical testing;Seals
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 07/03/2003 |
| Page Count | 20 |
| Themes | Seals |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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03/07/2003
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