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BS EN 62047-14:2012
Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials
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Summary
Electronic equipment and components;Test specimens;Vibration;Resonance;Thin-film devices;Bend testing;Electromechanical devices;Semiconductor technology;Semiconductor devices;Fatigue testing;Integrated circuits;Test equipment
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 05/31/2012 |
| Page Count | 22 |
| Themes | Test equipment |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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