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BS EN 62047-20:2014
Semiconductor devices. Micro-electromechanical devices Gyroscopes
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Summary
Vibration;Integrated circuits;Test equipment;Electronic equipment and components;Electromechanical devices;Test specimens;Thin-film devices;Semiconductor technology;Fatigue testing;Semiconductor devices;Resonance;Bend testing
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 10/31/2014 |
| Page Count | 56 |
| Themes | Bend testing |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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31/10/2014
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