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BS EN 62047-22:2014
Semiconductor devices. Micro-electromechanical devices Electromechanical tensile test method for conductive thin films on flexible substrates
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Summary
Thin-film devices;Semiconductor technology;Semiconductor devices;Electromechanical devices;Electronic equipment and components;Test equipment;Fatigue testing;Resonance;Integrated circuits;Test specimens;Bend testing;Vibration
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 10/31/2014 |
| Page Count | 14 |
| Themes | Vibration |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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