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BS EN 62047-8:2011
Semiconductor devices. Micro-electromechanical devices Strip bending test method for tensile property measurement of thin films
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Summary
Electronic equipment and components;Bend testing;Semiconductor technology;Strips;Test equipment;Tensile testing;Electromechanical devices;Test specimens;Thin films;Semiconductor devices;Integrated circuits
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 06/30/2011 |
| Page Count | 22 |
| Themes | Integrated circuits |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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