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BS EN 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
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Summary
Semiconductors;Semiconductor devices;Testing conditions;Transistors;Metal oxide semiconductors;Temperature;Voltage measurement;Electronic equipment and components
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 09/29/2006 |
| Page Count | 16 |
| Themes | Electronic equipment and components |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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29/09/2006
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