Active
Standard
Most Recent
BS EN 62374:2007
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Preview
Summary
Mathematical calculations;Electrical measurement;Semiconductor devices;Testing conditions;Semiconductors;Films (states of matter);Dielectric breakdown;Life (durability)
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 10/31/2008 |
| Page Count | 24 |
| Themes | Life (durability) |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.
Previous versions
31/10/2008
Active
Most Recent