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BS EN IEC 60749-12:2018
Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
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Summary
Climate;Frequencies;Mechanical testing;Electronic equipment and components;Environmental testing;Vibration testing;Destructive testing;Integrated circuits;Semiconductor devices;Variable
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 04/18/2018 |
| Page Count | 12 |
| Themes | Variable |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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18/04/2018
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