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BS EN IEC 60749-13:2018
Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
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Summary
Destructive testing;Environmental testing;Salt-spray tests;Electronic equipment and components;Mechanical testing;Accelerated corrosion tests;Climate;Integrated circuits;Accelerated testing;Salts;Corrosion resistance;Semiconductor devices
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 04/30/2018 |
| Page Count | 20 |
| Themes | Semiconductor devices |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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30/04/2018
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