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BS EN IEC 60749-17:2019
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
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Summary
Irradiation;Electronic equipment and components;Destructive testing;Climate;Neutrons;Military equipment;Integrated circuits;Military engineering;Dosimeters;Radiation measurement;Environmental testing;Mechanical testing;Nuclear particles;Space technology components;Degradation;Semiconductor devices
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 05/15/2019 |
| Page Count | 14 |
| Themes | Semiconductor devices |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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15/05/2019
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