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BS EN IEC 60749-18:2019
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
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Summary
Mechanical testing;Electronic equipment and components;Gamma-radiation;Space technology;Cobalt;Military engineering;Semiconductor devices;Environmental testing;Annealing;Integrated circuits;Ionizing radiation;Climate
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 06/10/2019 |
| Page Count | 26 |
| Themes | Climate |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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10/06/2019
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