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BS EN IEC 60749-23:2026
Semiconductor devices. Mechanical and climatic test methods High temperature operating life
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| Publisher | British Standards Institution (BSI) |
| Publication Date | 02/03/2026 |
| Page Count | 14 |
| Themes | Operating conditions |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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30/06/2011
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03/02/2026
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