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BS EN IEC 60749-26:2018
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
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Summary
Classification systems;Electrical testing;Damage;Mechanical testing;Grades (quality);Test models;Human body;Environmental testing;Electrostatics;Integrated circuits;Climate;Sensitivity;Degradation;Electronic equipment and components;Semiconductor devices
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 04/30/2018 |
| Page Count | 54 |
| Themes | Semiconductor devices |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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