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BS EN IEC 60749-30:2020
Semiconductor devices. Mechanical and climatic test methods Preconditioning of non-hermetic surface mount devices prior to reliability testing
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Summary
Semiconductor devices;Electronic equipment and components;Mechanical testing;Performance testing;Specimen preparation;Environmental testing;Reliability;Climate;Surface mounting devices;Integrated circuits
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 09/30/2020 |
| Page Count | 18 |
| Themes | Integrated circuits |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
