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BS EN IEC 60749-41:2020
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing of non-volatile memory devices
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Summary
Flammability;Moisture measurement;Defects;Solderability testing;Storage;Testing conditions;Visual inspection (testing);Marking;Stress;Fire tests;Test equipment;Vibration testing;Temperature measurement;Specimen preparation;Semiconductor devices;Accelerated testing;Bonding;Electric terminals;Electrical testing;Endurance testing;Test specimens;Thermal-shock tests;Environmental testing;Strength of materials;Mass spectrometry;Classification systems;Integrated circuits;Damp-heat tests;Shear testing;Low-pressure tests;Thermal testing;Mechanical testing;Leak tests;Radioactive tracer methods;Electronic equipment and components;Pull-out tests;Dimensional measurement;Torsion testing
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 09/09/2020 |
| Page Count | 26 |
| Themes | Torsion testing |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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