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BS EN IEC 63287-2:2023
Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
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Summary
Doping (semiconductors);Electrical equipment;Semiconductor materials;Semiconductor switches;Semiconductor technology
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 05/23/2023 |
| Page Count | 22 |
| Themes | Semiconductor technology |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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23/05/2023
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