BS IEC 60747-14-1:2010
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BS IEC 60747-14-1:2010

Semiconductor devices sensors. Generic specification for sensors

Summary

Inspection;Integrated circuits;Electronic equipment and components;Dielectric materials;Probes;Quality assurance;Testing conditions;Ferroelectric materials;Semiconductor devices;Specification (approval);Qualification approval;Semiconductors

Technical characteristics

Publisher British Standards Institution (BSI)
Publication Date 04/30/2010
Page Count 26
Themes Semiconductors
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ISBN ---
Weight (in grams) ---
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