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BS IEC 60747-14-2:2000
Discrete semiconductor devices and integrated circuits. Semiconductor devices. sensors Hall elements
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Summary
Probes;Hall effect;Semiconductor devices;Electronic equipment and components;Magnetic field effects;Integrated circuits
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 05/15/2001 |
| Page Count | 18 |
| Themes | Integrated circuits |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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