BS IEC 60747-3:2013
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BS IEC 60747-3:2013

Semiconductor devices Discrete devices: Signal, switching and regulator diodes

Summary

Ratings;Performance testing;Diodes;Current measurement;Electronic equipment and components;Semiconductor devices;Switches;Semiconductor diodes;Power measurement (electric);Test equipment;Symbols;Resistance measurement;Power losses;Noise (spurious signals);Definitions;Endurance testing;Voltage measurement;Electrical properties and phenomena;Capacitance measurement;Electrical measurement;Testing conditions;Failure (quality control);Circuits;Charge measurement;Letters (symbols);Electrical testing;Electrical conductance;Voltage-reference diodes;Signal diodes;Efficiency

Technical characteristics

Publisher British Standards Institution (BSI)
Publication Date 04/30/2015
Page Count 38
Themes Efficiency
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