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BS IEC 60747-5-16:2023

Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage GaN-based light diodes based on photocurrent spectroscopy

Summary

Doping (semiconductors);Semiconductor convertors;Semiconductor materials;Components;Computer components;Electrical components;Electronic equipment and components;Semiconductor storage

Technical characteristics

Publisher British Standards Institution (BSI)
Publication Date 04/05/2023
Page Count 22
Themes Semiconductor storage
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