BS IEC 60747-8:2000
Superseded Standard
Historical

BS IEC 60747-8:2000

Discrete semiconductor devices and integrated circuits Field-effect transistors Additional ratings characteristics amds in the measuring methods for power switching field effect transistors.
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Technical characteristics

Publisher British Standards Institution (BSI)
Publication Date 06/15/2001
Cancellation Date 06/30/2011
Page Count 72
Themes Integrated circuits
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