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BS IEC 62047-28:2017
Semiconductor devices. Micro-electromechanical devices Performance testing method of vibration-driven MEMS electret energy harvesting
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Summary
Test equipment;Test specimens;Vibration;Resonance;Bend testing;Fatigue testing;Thin-film devices;Integrating circuits;Semiconductor technology;Electromechanical devices;Electronic equipment and components;Semiconductor devices
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 07/22/2020 |
| Page Count | 20 |
| Themes | Semiconductor devices |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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