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BS IEC 62047-29:2017
Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
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Summary
Analysis;Test methods;Electromechanical devices;Semiconductor devices;Thin films
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 03/15/2018 |
| Page Count | 16 |
| Themes | Thin films |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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