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BS IEC 62047-32:2019
Semiconductor devices. Micro-electromechanical devices Test method for the nonlinear vibration of MEMS resonators
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Summary
Terminology;Semiconductor devices;Vocabulary;Semiconductor technology;Electromechanical devices;Electronic equipment and components;Integrated circuits
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 01/29/2019 |
| Page Count | 22 |
| Themes | Integrated circuits |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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