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BS IEC 62047-34:2019
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
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Summary
Electronic equipment and components;Terminology;Semiconductor devices;Electromechanical devices;Semiconductor technology;Integrated circuits;Vocabulary
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 04/16/2019 |
| Page Count | 20 |
| Themes | Vocabulary |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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