Active
Standard
Most Recent
BS IEC 62047-36:2019
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Preview
Summary
Terminology;Electronic equipment and components;Electromechanical devices;Semiconductor technology;Integrated circuits;Semiconductor devices;Vocabulary
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 04/24/2019 |
| Page Count | 20 |
| Themes | Vocabulary |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.