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BS IEC 62047-38:2021

Semiconductor devices. Micro-electromechanical devices Test method for adhesion strength of metal powder paste in MEMS interconnection

Summary

Vocabulary;Electromechanical devices;Integrated circuits;Terminology;Electronic equipment and components;Semiconductor technology;Semiconductor devices

Technical characteristics

Publisher British Standards Institution (BSI)
Publication Date 07/07/2021
Page Count 16
Themes Semiconductor devices
EAN ---
ISBN ---
Weight (in grams) ---
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