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BS IEC 62880-1:2017
Semiconductor devices. Stress migration test standard Copper stress
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Summary
Electromechanical devices;Electronic equipment and components;Integrated circuits;Vocabulary;Terminology;Semiconductor devices;Semiconductor technology
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 07/21/2020 |
| Page Count | 28 |
| Themes | Semiconductor technology |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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21/07/2020
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