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BS IEC 63003:2015
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM
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Summary
Records (documents);Data processing;Life cycle;Software engineering techniques;Data management;Documents;Information;Process control;Data;Life (durability);Computer software
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 01/31/2016 |
| Page Count | 174 |
| Themes | Computer software |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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