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BS IEC 63068-1:2019
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Classification
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Summary
Electronic equipment and components;Integrated circuit technology;Semiconductor devices;Defects;Silicon carbide
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 05/10/2019 |
| Page Count | 26 |
| Themes | Silicon carbide |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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